Physical Analysis
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Publications

Publications in Scientific Journals

  1. T. Frömling, A. Schintlmeister, H. Hutter, J. Fleig:
    "Oxide Ion Transport in Donor-Doped Pb(ZrxTi1-x)O3: The Role of Grain Boundaries";
    Journal of American Ceramic Society, 94 (2011), S. 1173 - 1181.

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  2. J. Fleig, A. Schintlmeister, A. Opitz, H. Hutter:
    "The determination of the three-phase boundary width of solid oxide fuel cell cathodes by current-driven 18O tracer incorporation";
    Scripta Materialia, 65 (2011), S. 78 - 83.

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  3. M. Kubicek, A. Limbeck, T. Frömling, H. Hutter, J. Fleig:
    "Relationship between Cation Segregation and the Electrochemical Oxygen Reduction Kinetics of La0.6Sr0.4CoO3-δ Thin Film Electrodes";
    Journal of the Electrochemical Society, 158 (2011), S. 727 - 734.

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  4. M. Gerstl, T. Frömling, A. Schintlmeister, H. Hutter, J. Fleig:
    "Measurement of 18O tracer diffusion coefficients in thin yttria stabilized zirconia films";
    Solid State Ionics, 184 (2011), S. 23 - 26.

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  5. R. Franz, J. Schnöller, H. Hutter, C. Mitterer:
    "Oxidation and diffusion study on AlCrVN hard coatings using oxygen isotopes 16O and 18O";
    Thin Solid Films, 519 (2011), 12; S. 3974 - 3981.

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  6. M. Holzweber, E. Pittenauer, H. Hutter:
    "Investigation of the ionic liquids under Bi-ion and Bi-cluster ions bombardment by TOF-SIMS";
    Journal of Mass Spectrometry, 45 (2010), 10; S. 1104 - 1110.

  7. S. Krivec, T. Detzel, M. Buchmayr, H. Hutter:
    "On the temperature dependence of Na migration in thin SiO2 films during TOF-SIMS O2+ depth profiling";
    Applied Surface Science, 257 (2010), S. 25 - 32.

  8. S. Krivec, M. Buchmayr, T. Detzel, M. Nelhiebel, H. Hutter:
    "Voltage-assisted sodium ion incorporation and transport in thin silicon dioxide films";
    Surface and Interface Analysis, 42 (2010), 6; S. 886 - 890.

  9. M. Holzweber, H. Hutter:
    "Investigation of the 1-butyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi Cluster ion bombardment";
    Surface and Interface Analysis, 42 (2010), 6; S. 1025 - 1029.

  10. S. Puchner, A. Zechmann, T. Detzel, H. Hutter:
    "Titanium layers on aluminum bond pads: Characterization of thin layers on rough surfaces";
    Surface and Interface Analysis, 42 (2010), 6; S. 779 - 782.

  11. J. Paulitsch, M. Schenkel, A. Schintlmeister, H. Hutter, P. Mayrhofer:
    "Low friction CrN/TiN multilayer coatings prepared by a hybrid high power impuls magnetron sputtering/DC magnetron sputtering deposition technique";
    Thin Solid Films, 19 (2010), 518; S. 5553 - 5557.

  12. R. Kögler, C. Dubois, J. Gerlach, H. Hutter, W. Skorupa:
    "Trans-RP gettering and out-diffusion of oxygen implanted into highly B-doped silicon";
    Solid State Phenomena, 156-158 (2010), S. 375 - 380.

  13. T. Colomb, S. Krivec, H. Hutter, A. Akatay, N. Pavillon, F. Montfort, E. Cuche, J. Kuhn, C. Depeursinge, Y. Emery:
    "Digital holographic reflectometry";
    Optics Express, 18 (2010), 4; S. 3719 - 3731.

  14. C. Henkel, O. Bethge, S. Abermann, S. Puchner, H. Hutter, E. Bertagnolli:
    "Pt-assisted oxidation of "100...-Ge/high-k interfaces and improvement of their electrical quality";
    Applied Physics Letters, 97 (2010), S. 1529041 - 1529043.

  15. A. Opitz, A. Schintlmeister, H. Hutter, J. Fleig:
    "Visualization of oxygen reduction sites at Pt electrodes on YSZ by means of 18O tracer incorporation: the width of the electrochemically active zone";
    Physical Chemistry Chemical Physics, 12 (2010), S. 12734 - 12745.

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  16. O. Bethge, S. Abermann, C. Henkel, C. Straif, H. Hutter, J. Smoliner, E. Bertagnolli:
    "Process temperature dependent high frequency capacitance-voltage response of ZrO2/GeO2/germanium capacitors";
    Applied Physics Letters, 96 (2010), S. 0529021 - 0529023.

  17. R. Hula, C. Edtmaier, M. Holzweber, H. Hutter, C. Eisenmenger-Sittner:
    "The wetting behaviour of silver on carbon, pure and carburized nickel, cobalt and molybdenum substrates";
    Applied Surface Science, 256 (2010), 14; S. 4697 - 4701.

  18. M. Pfeiler, C. Scheu, H. Hutter, J. Schnöller, C. Michotte, C. Mitterer, M. Kathrein:
    "On the effect of Ta on improved oxidation resistance of Ti-Al-Ta-N coatings";
    Journal of Vacuum Science & Technology A, 27(3) (2009), S. 554 - 560.

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  19. Ch. Straif, H. Hutter:
    "Investigation of polymer thin films by use of Bi-cluster-ion-supported time of flight secondary ion mass spectrometry";
    Analytical and Bioanalytical Chemistry, 393(8) (2009), S. 1889 - 1898.

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  20. J. Schnöller, R. Franz, C. Mitterer, H. Hutter:
    "TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings";
    Analytical and Bioanalytical Chemistry, 396(8) (2009), S. 1857 - 1861.

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  21. J. Schnöller, E. Pittenauer, H. Hutter, G. Allmaier:
    "Analysis of antioxidants in insulation cladding of copper wire: a comparison of different mass spectrometric techniques (ESI-IT, MALDI-RTOF and RTOF-SIMS)";
    Journal of Mass Spectrometry, 44 (2009), S. 1724 - 1732.

  22. S. Abermann, C. Henkel, O. Bethge, C. Stralf, H. Hutter, E. Bertagnolli:
    "Lanthanum-Zirconate and Lanthanum-Aluminate Based High-κ Dielectric Stacks on Silicon Substrates";
    Journal of the Electrochemical Society, 156 (2009), S. 53 - 57.

  23. O. Bethge, S. Abermann, C. Henkel, C. Stralf, H. Hutter, E. Bertagnolli:
    "Impact of Germanium Surface Conditioning and ALD-growth Temperature on Al2O3/ZrO2 High-κ Dielectric Stacks";
    Journal of the Electrochemical Society, 156 (2009), S. 168 - 172.

  24. D. Schäfer, J. Hell, C. Eisenmenger-Sittner, E. Neubauer, H. Hutter, N. Kornfeind:
    "Suppression of de-wetting of copper coatings on carbon substrates by metal (Cr, Mo, Ti) doped boron interlayers";
    Vacuum, 84 (2009), S. 202 - 204.

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  25. R. Wiesinger, J. Schnöller, H. Hutter, M. Schreiner, C. Kleber:
    "About the Formation of Basic Silver Carbonate on Silver Surfaces - An In Situ IRRAS Study";
    The Open Corrosion Journal, 2 (2009), S. 96 - 104.

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  26. R. Franz, J Neidhardt, C. Mitterer, H. Hutter, B. Satory, R. Tessadri, P. Polcik:
    "Oxidation and diffusion processes during annealing of AlCrVN hard coatings";
    Journal of Vacuum Science & Technology A, 26(2) (2008), S. 302 - 308.

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  27. M. Kiniger, C. Eisenmenger-Sittner, J. Hell, B. Schwarz, H. Hutter, S. Puchner:
    "Carbide formation upon heat treatment of molybdenum layers deposited on carbon substrates: comparison of experimental data with a cellular automaton model";
    Surf. Interface Anal., 40 (2008), 3-4; S. 786 - 789.

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  28. C. Braunshier, C. Hametner, J. Fröhlich, J. Schnöller, H. Hutter:
    "Novel monodisperse PEG-grafted polystyrene resins: synthesis and application in gel-phase 13C NMR spectroscopy";
    Tetrahedron Letters, 49 (2008), S. 7103 - 7105.

  29. C. Kleber, R. Wiesinger, J. Schnöller, U. Hilfrich, H. Hutter, M. Schreiner:
    "Initial oxidation of silver surfaces by S2-and S4+ species";
    Corrosion Science, 50 (2008), 4; S. 1112 - 1121.

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  30. S. Puchner, H. Hutter, C. Eisenmenger-Sittner, M. Kiniger:
    "TOF-SIMS investigations on thermally treated copper-molybdenum films on a carbon substrate";
    angenommen für Analytical and Bioanalytical Chemistry.

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  31. T. Kolber, K. Piplits, L. Palmetshofer, H. Hutter:
    "Characterisation of the element distribution within TiN coatings with SIMS";
    Microchimica Acta, 135 (2000), (1-2); S. 105 - 111.

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  32. M. Gritsch, C. Brunner, K. Piplits, H. Hutter, P. Wilhartitz, A. Schintlmeister, H. Martinz:
    "Application of scanning SIMS techniques for the evaluation of the oxidation behaviour of high-purity molybdenum";
    Fresenius Journal of Analytical Chemistry, 365 (1999), 1-3; S. 188 - 194.

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  33. J. Schnöller, R. Wiesinger, C. Kleber, U. Hilfrich, M. Schreiner, H. Hutter:
    "TOF-SIMS investigations on weathered silver surfaces";
    Analytical and Bioanalytical Chemistry, 390 (2008), 6; S. 1543 - 1549.

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  34. G. Otto, G. Hobler, L. Palmetshofer, K. Mayerhofer, K. Piplits, H. Hutter:
    "Dose-rate dependence of damage formation in Si by N implantation as determined from channeling profile measurements";
    Nuclear Instruments & Methods B, 242 (2006), S. 667 - 669.

  35. R. Kögler, A. Mücklich, J. Kaschny, H. Reuther, F. Eichhorn, H. Hutter, W. Skorupa:
    "Defect engineering in ion beam synthesis of SiC and SiO2 in Si";
    Solid State Phenomena, 108-109 (2005), S. 321 - 326.

  36. D. Krecar, M. Rosner, M. Draxler, P. Bauer, H. Hutter:
    "Quantitative analysis of the Ge concentration in a SiGe quantum well: comparison of low-energy RBS and SIMS measurements";
    Analytical and Bioanalytical Chemistry, 384 (2005), 2; S. 525 - 530.

  37. K. Mayerhofer, C. Schrank, C. Eisenmenger-Sittner, H. Hutter:
    "Characterisation of molybdenum intermediate layers in Cu-C system with SIMS method";
    Applied Surface Science, 252 (2005), 1; S. 266 - 270.

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  38. D. Krecar, J. Zwanziger, V. Vassileva, H. Danninger, H. Hutter:
    "2D and 3D SIMS investigations on sintered steels";
    Applied Surface Science, 252 (2005), 1; S. 282 - 285.

  39. D. Krecar, M. Fuchs, R. Kögler, H. Hutter:
    "SIMS investigation of gettering centres produced by phosphorus MeV ion implantation";
    Applied Surface Science, 252 (2005), 1; S. 278 - 281.

  40. K. Mayerhofer, J. Foisner, K. Piplits, G. Hobler, L. Palmetshofer, H. Hutter:
    "Range evaluation in SIMS depth profiles of Er - implantations in silicon";
    Applied Surface Science, 252 (2005), 1; S. 271 - 277.

  41. K. Mayerhofer, K. Piplits, R. Traum, M. Griesser, H. Hutter:
    "Investigations of corrosion phenomena on gold coins with SIMS";
    Applied Surface Science, 252 (2005), 1; S. 133 - 138.

  42. D. Krecar, M. Rosner, M. Draxler, P. Bauer, H. Hutter:
    "Low energy RBS and SIMS analysis of the SiGe quantum well";
    Applied Surface Science, 252 (2005), 1; S. 123 - 126.

  43. D. Krecar, M. Fuchs, R. Kögler, H. Hutter:
    "Investigation of gettering effects in CZ-type silicon with SIMS";
    Analytical and Bioanalytical Chemistry, 381 (2005), 8; S. 1526 - 1531.

  44. M. Rosner, E. Neubauer, C. Eisenmenger-Sittner, H. Hutter:
    "Characterisation of the interface of sputter-deposited copper coatings on nitrogen plasma-treated carbon substrates";
    Analytical and Bioanalytical Chemistry, 380 (2004), 5-6; S. 838 - 842.

  45. J. Lackner, W. Waldhauser, R. Ebner, M. Beutl, G. Jakopic, G. Leising, H. Hutter, M. Rosner:
    "Pulsed laser deposition of non-stoichiometric silicon nitride (SiNx) thin films";
    Applied Physics A: Materials Science & Processing, A79 (2004), 4-6; S. 1525 - 1527.

  46. K. Gammer, M. Stoiber, J. Wagner, H. Hutter, R. Kullmer, C. Mitterer:
    "Investigations on the effects of plasma-assisted pre-treatment for plasma-assisted chemical vapor deposition TiN coatings on tool steel";
    Thin Solid Films, 461 (2004), 2; S. 277 - 281.

  47. S. Dreer, P. Wilhartitz, K. Piplits, K. Mayerhofer, J. Foisner, H. Hutter:
    "Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs";
    Analytical and Bioanalytical Chemistry, 379 (2004), 4; S. 599 - 604.

  48. D. Krecar, V. Vassileva, H. Danninger, H. Hutter:
    "Phosphorus as sintering activator in powder metallurgical steels: Characterization of the distribution and its technological impact";
    Analytical and Bioanalytical Chemistry, 379 (2004), S. 610 - 618.

  49. D. Krecar, V. Vassileva, H. Danninger, H. Hutter:
    "Characterization of the distribution of the sintering activator boron in powder metallurgical steels with SIMS";
    Analytical and Bioanalytical Chemistry, 379 (2004), S. 605 - 609.

  50. H. D. Wanzenböck, E. Bertagnolli, B. Basnar, J. Smoliner, M. Gritsch, H. Hutter, J. Brenner, C. Tomastik, H. Störi:
    "Surface and interface study of ion beam deposited silicon oxide thin films";
    Electrochemical Society Interface, 2001-2007 (2001), S. 44 - 51.

  51. R. Kögler, A. Peeva, F. Eichhorn, J. Kaschny, M. Voelskow, W. Skorupa, H. Hutter:
    "Implantation Induced Defects in Silicon Detected by Cu Decoration Techniques";
    Electrochemical Society Interface, 2001-29 (2001).

  52. H. D. Wanzenböck, A. Lugstein, H. Langfischer, E. Bertagnolli, M. Gritsch, H. Hutter:
    "Ion beam induced chemical vapour deposition of dielectric materials";
    Mat. Res. Soc. Symp. Proc., 624 (2001), S. 163 - 170.

  53. M. Rosner, C. Eisenmenger-Sittner, H. Hutter:
    "Investigations on codeposited aluminium-tin systems with SIMS";
    Journal of Trace and Microprobe Techniques, 19 (2001), 1; S. 91 - 98.

  54. C. Pollak, K. Reichmann, H. Hutter:
    "SIMS Investigation of chemical solution-deposited SrTiO3/LaNiO3";
    Applied Surface Science, 179 (2001), 1-4; S. 134 - 138.

  55. H. Hutter, K. Nowikow, K. Gammer:
    "Visualisation of 3D SIMS measurements ";
    Applied Surface Science, 179 (2001), 1-4; S. 162 - 167.

  56. K. Gammer, S. Musser, H. Hutter:
    "Characterisation of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS";
    Applied Surface Science, 179 (2001), 1-4; S. 241 - 245.

  57. C. Heinisch, K. Piplits, F. Kubel, A. Schintlmeister, E. Pfluger, H. Hutter:
    "SIMS investigation of MoS2 based sputtercoatings";
    Applied Surface Science, 179 (2001), 1-4; S. 269 - 274.

  58. K. Mayerhofer, E. Neubauer, C. Eisenmenger-Sittner, H. Hutter:
    "Characterisation of Cr intermediate layers in Cu-C-systems with SIMS method";
    Applied Surface Science, 179 (2001), 1-4; S. 276 - 281.

  59. I. Constantinides, M. Gritsch, A. Adriaens, H. Hutter, F. Adams:
    "Microstructural characterisation of five simulated archaeological copper alloys using light microscopy, scanning electron microscopy, energy dispersive X-ray microanalysis and secondary ion mass spectrometry";
    Analytica Chimica Acta, 440 (2001), 2; S. 189 - 198.

  60. M. Gritsch, K. Piplits, R. Barbist, P. Wilhartitz, H. Hutter:
    "SIMS Analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys";
    Materials and Corrosion, 52 (2001), 7; S. 501 - 508.

  61. C. Pollak, H. Hutter, P. Warbichler, K. Reichmann:
    "Clarification by TEM and SIMS of abnormal Ti depth distribution in chemical solution-deposited SrTiO3/La0.5Sr0.5CoO3";
    Fresenius Journal of Analytical Chemistry, 371 (2001), 1; S. 54 - 57.

  62. C. Pollak, T. Stubbings, H. Hutter:
    "Total Differential Image Correction";
    Journal of Computer-Assisted Microscopy, 10 (2001), 3; S. 113 - 121.

  63. C. Pollak, T. Stubbings, H. Hutter:
    "Differential image disortion correction";
    Microscopy and Microanalysis, 7 (2001), 4; S. 335 - 340.

  64. H. D. Wanzenböck, H. Langfischer, S. Harasek, B. Basnar, H. Hutter, E. Bertagnolli:
    "Versatile nanodeposition of dielectrics and metals by non-contact direct-write";
    Mat. Res. Soc. Symp. Proc., 758 (Rapid Prototyping Technologies) (2003), S. 157 - 162.

  65. M. Stoiber, J. Wagner, C. Mitterer, K. Gammer, H. Hutter, C. Lugmair, R. Kullmer:
    "Plasma-assisted pre-treatment for PACVD TiN coatings on toll steel";
    Surface & Coatings Technology, 174-175 (2003), S. 687 - 693.

  66. H. D. Wanzenböck, S. Harasek, E. Bertagnolli, M. Gritsch, H. Hutter, J. Brenner, H. Störi, U. Grabner:
    "Direct-write deposition of silicon oxide - the express lane towards patterned thin films";
    Electrochemical Society Interface, 2003 (2003), 2; S. 369 - 380.

  67. R. Kogler, A. Peeva, A. Lebedev, M. Posselt, W. Skorupa, G. Oetzelt, H. Hutter, M. Behar:
    "Cu gettering in ion implanted and annealed silicon in regions before and beyond the mean projected ion range";
    Journal of Applied Physics, 94 (2003), 6; S. 3834 - 3839.

  68. M. Rosner, C. Kleber, M. Schreiner, H. Hutter:
    "SIMS and TM-AFM studies on weathered Cu, Zn, and brass (CuZn10, CuZn30) surfaces";
    Journal of Trace and Microprobe Techniques, 21 (2003), 1; S. 49 - 62.

  69. K. Gammer, M. Rosner, G. Poeckl, H. Hutter:
    "AES and SIMS analysis of non-metallic inclusions in a low carbon chromium steel";
    Analytical and Bioanalytical Chemistry, 376 (2003), 2; S. 255 - 259.

  70. J. Lackner, W. Waldhauser, R. Ebner, W. Lenz, C. Suess, G. Jakopic, G. Leising, H. Hutter:
    "Pulsed laser deposition: A new technique for deposition of amorphous SiOx thin films";
    Surface & Coatings Technology, 163-164 (2003), S. 300 - 305.

  71. K. Gammer, E. Ogris, P. Uggowitzer, H. Hutter:
    "SIMS Investigations on the Distribution of Trace Elements in Modified Aluminium-Silicon-Magnesium Alloys";
    Microchimica Acta, 141 (2003), 1-2; S. 23 - 27.

  72. S. Dreer, P. Wilhartitz, K. Piplits, H. Hutter, M. Kopnarski, G. Friedbacher:
    "Quantitative Sputter Depth Profiling on Silicon- and Aluminium Oxinitride Films";
    Microchimica Acta, 133 (2000), S. 75 - 87.

  73. C. Kleber, M. Rosner, H. Hutter, M. Schreiner:
    "Influence of increasing zinc contents in brass in the early stages of corrosion investigated by in-situ TM-AFM and SIMS";
    Analytical and Bioanalytical Chemistry, 374 (2002), 4; S. 338 - 343.

  74. C. Heinisch, P. Ramminger, H. Hutter:
    "SIMS investigation of CrN sputtercoatings";
    Analytical and Bioanalytical Chemistry, 374 (2002), 4; S. 592 - 596.

  75. M. Rosner, G. Poeckl, H. Danninger, H. Hutter:
    "2D- and 3D SIMS investigations on hot-pressed steel powder HS 6-5-3-8";
    Analytical and Bioanalytical Chemistry, 374 (2002), 4; S. 597 - 601.

  76. C. Pollak, B. Malic, M. Kosec, S. Javoric, H. Hutter:
    "Chemical solution-deposited PbZr0.53Ti0.47O3 on La0.5Sr0.5CoO3. SIMS investigation of the effect of different precursor additives on the layer structure";
    Analytical and Bioanalytical Chemistry, 374 (2002), 4; S. 608 - 613.

  77. H. Langfischer, B. Basnar, H. Hutter, E. Bertagnolli:
    "Evolution of tungsten film deposition induced by focused ion beam";
    Journal of Vacuum Science & Technology A, 20 (2002), 4; S. 1408 - 1415.

  78. R. Niessner, J. Broekaert, J. Einax, H. Emons, W. Engewald, K. Heumann, H. Hutter et al.:
    "Trendbericht Analytische Chemie 2000/2001";
    Nachrichten aus der Chemie, 50 (2002), 4; S. 483 - 487.

  79. R. Niessner, J. Broekaert, J. Einax, H. Emons, W. Engewald, K. Heumann, H. Hutter et al.:
    "Analytical chemistry 2000/2001";
    Nachrichten aus der Chemie, 50 (2002), 4; S. 455 - 464.

  80. C. Pollak, A. Busic, K. Reichmann, H. Hutter:
    "SIMS characterisation of chemical solution deposited thin film systems of BaTiO3/X (X=LaNiO3, La0.5Sr0.5CoO3, La0.7Sr0.3MnO3) on a platinised silicon wafer";
    Thin Solid Films, 405 (2002), S. 218 - 223.

  81. R. Kögler, A. Peeva, J. Kaschny, W. Skorupa, H. Hutter:
    "Defect engineering and prevention of impurity gettering at Rp/2 in ion-implanted silicon.";
    Solid State Phenomena, 82-84 (2002), S. 399 - 404.

  82. C. Pollak, K. Reichmann, H. Hutter:
    "Comparative study of LNO, LSCO and LSMO as electrode layers for microelectronic capacitors by dynamic SIMS";
    Surface & Coatings Technology, 150 (2002), S. 119 - 124.

  83. R. Kögler, A. Peeva, J. Kaschny, W. Skorupa, H. Hutter:
    "Prevention of impurity gettering in the RP/2 region of ion-implanted silicon by defect engineering";
    Nuclear Instruments & Methods in Physics Research B, 186 (2002), S. 298 - 302.

  84. K. Gammer, M. Gritsch, A. Peeva, R. Kögler, H. Hutter:
    "Characterization of carbon-boronnitride-coatings prepared with chemical vapor deposition by auger electron spectroscopy, electron probe microanalysis and secondary ion mass spectrometry";
    Journal of Trace and Microprobe Techniques, 20 (2002), 1; S. 47 - 55.

  85. K. Gammer, T. Kolber, K. Piplits, K. Nowikow, X. Tang, R. Haubner, H. Hutter:
    "Characterization of carbon-boron nitride-coatings prepared with chemical vapor deposition by auger electron spectroscopy, electron probe microanalysis and secondary ion mass spectrometry";
    Thin Solid Films, 406 (2002), 1-2; S. 98 - 102.

  86. K. Mayerhofer, E. Neubauer, C. Eisenmenger-Sittner, H. Hutter:
    "Adhesion promotion of Cu on C by Cr intermediate layers investigated by the SIMS method";
    Analytical and Bioanalytical Chemistry, 374 (2002), S. 602 - 607.

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