Technische Universität Wien
Research-Group Micro- and Nanoanalysis
The research group focuses on the application and development of scanning probe microscopy techniques (atomic force microscopy - AFM, scanning tunneling microscopy - STM) and electron probe x-ray microanalysis (EPXMA, scanning electron microscopy - SEM) for characterization of surfaces and surface processes on a wide variety of inorganic, organic, and biological materials.
Recent research topics
- Investigation of protein-protein interaction on the single molecule level
- Investigation of conduction paths through degraded piezo materials
- Investigation of nano-particles
- Investigation of Self Assembled Monolayers
Publications
- Publication data base of Vienna University of Technology
- Surface and Thin Film Analysis, edited by G. Friedbacher and H. Bubert, Wiley-VCH, 2011
- Surface and Interface Analysis (chapter in Analytical Chemistry, eds. R. Kellner et al., Wiley-VCH, 2004)
Equipment
- NanoScope V (Bruker) scanning probe microscope
- Quanta 200 (FEI) scanning electron microscope with Genesis (EDAX) energy dispersive spectrometer
- Digital light microscope (Leica)